Located in Liestal, Basel, Switzerland, Nanosurf is a company specializing in the development and production of atomic force microscopes, specializing in high-end nano measurement analysis and manipulation technology tools for atomic force microscopes based on AFM technology. For more than a decade, Nanosurf has been committed to high-end commercial AFM and STM research, using new electromagnetic coil and flatbed scanning technology, please the shortcomings of the old piezoelectric ceramic scanning technology.
一 Small sample measurement atomic force microscope
peculiarity
- Integrated small sample atomic force microscope NaioAFM
- High-end modular flatbed scanning research Flex-Axiom
- Easy to install, integrated, removable type AFM type AFM type atomic force microscope
- Hydrodynamic atomic force microscopy Flex-FPM with hollow probe
- The machine can be customized according to customer requirements and customized sample table with the user
- The all-in-one scanning tunnel does not go through NaiosTM
- Integrated with the latest Corecai’yon AFM
- Bio-based Flex-Bio based on FlexAFM technology
- Fully automated nanomechanical property measurement type atomic force microscope Flex-ANA
LensAFM lens-type atomic force microscope
Can replace an objective lens on the optical microscope or optical profiler, high-precision roughness, step height machine for nano-level three-dimensional contour and other measurements, while measuring phase, electric field, magnetic field, conductive power and other advanced physical quantities, is the three-dimensional expansion function of the optical microscope or optical profiler.
- The scanning method is needle tip scanning, and the sample does not move during the scanning process
- XY direction scanning range 70um×70um, scanner Z direction measurement range 14um
Noise level: less than 0.5nm - Measurement mode: static force mode, dynamic force mode
- Spectral line measurement modes: Force and Distance Curve, Amplitude-Distance Curve, Voltage-Distance Curve, XYZ Triaxial Scan and Position Control, 24-bit DAC
NaioAFM miniaturized atomic force microscope
It is the most ideal atomic force microscope for small samples. The all-in-one NaioAFM system is stable in performance, easy to operate, economical in price, and compact in size, suitable for all types of people, and easy to place anywhere.
- XY direction scanning range 70um, scanner Z direction measurement range 14um
- Noise level: less than 0.5nm
- Built-in integrated micron mobile table: XY directional movement range of 12mm×12mm
- Sample size: 12mm× 12mm can be tested to each point on the sample
- It can be placed up to 30mm ×30mm with limited range of movement
- Sample thickness: max. 3.5mm
Flex-PFM next-generation nanomanueled and single-cell biology microfluidic tool AFM
Highly accurate pressure, force and position control with a user-friendly FluidFM@Arya operator software through optical probe methods are fully integrated with the system FluidFM@ microfluidic control system compatible with major inverted microscope brands.
FLex-Axiom atomic-level high-resolution AFM imaging
Flex-Axiom’s 100um truly low-noise new scanner. High-resolution scanning on large machines. Refer to the low-noise data of the closed-loop system as shown above (roughness measurement under the surface of the hyperspectral silicon wafer, roughness of about 1A)
- Different FluidFm@ probes: hollow cantilever needles designed for biological cell applications
- FluidFM@ micropipette: A probe tip cantilever with an opening at the end of the cantilever
- FluidFM@ nanopipette: a cantilever probe with an opening at the tip
- FluidFM@ Fast Circular Probe: Cantilever with closed tapered tip for fiber optic filing
二 Specialized atomic force microscope for large sample measurement
CoreAFM integrated large-scale scanning atomic force microscope
It can measure high-precision rough plating, step height, and micro-nano-scale three-digit contours, and can also measure various advanced physical quantities such as phase, electric field, magnetic field, and conductive power.
- Integrated large-range scanning probe system: including Y scanner, Z-direction automatic approximation motor, laser reflective cantilever.
- Structure, dual optical path auxiliary optical system in one.
- The scanning method is needle tip scanning, and the sample does not move during the scanning process.
- The XY direction scanning range is 100 μm, and the scanner Z direction measurement range is 12 μm
- Noise level: less than 04nm.
- Maximum sample size: 100mm x 150mm, sample thickness up to 10mm, small sample 40mm.
- Easy to replace the probe, replace the probe without manual adjustment of the laser, the laser automatic positioning, greatly convenient for customers to operate
- Dual optical path auxiliary optical system: top and side view, color 5 million pixel camera, optical resolution 2μ
- Equipped with an active shock absorber, the active vibration isolation frequency is as low as 6Hz.
 Electric XZ axis displacement table |  |
 Motorized XYZ axis displacement designed for large grating samples |  |
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